TEST SOCKET FOR SEMICONDUCTOR IC TEST

摘要

PURPOSE: A semiconductor test socket for using various types of conductors manufactured by conductive wires as a conductive path is provided to improve electrical characteristic by using various shapes of conductors as the conductive wires. CONSTITUTION: A socket body(110) has elasticity and non-conductive property. A conductor(120) is inserted to a socket housing. The conductor forms electric passages between a lead terminal of a semiconductor device and a test terminal of a test substrate by using the conductive property. The conductor is inserted in order to arrange the socket body. The conductor includes a first conductive wire.