发明名称 Tunnel field effect transistor
摘要 A tunnel transistor includes source diffusion (4) of opposite conductivity type to a drain diffusion (6) so that a depletion layer is formed between source and drain diffusions in a lower doped region (8). An insulated gate (16) controls the position and thickness of the depletion layer. The device includes a quantum well formed in accumulation layer (20) which is made of a different material to the lower layer (2) and cap layer (22).
申请公布号 US7839209(B2) 申请公布日期 2010.11.23
申请号 US20070444140 申请日期 2007.10.03
申请人 NXP B.V. 发明人 CURATOLA GILBERTO;AGARWAL PRABHAT;SLOTBOOM JAN W.;HURKX GODEFRIDUS A. M.;SURDEANU RADU;DOORNBOS GERBEN
分类号 H01L25/00 主分类号 H01L25/00
代理机构 代理人
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