发明名称 Method of programming and erasing a p-channel BE-SONOS NAND flash memory
摘要 A programming method for a p-channel memory cell, the memory cell includes a source, a drain and a gate. The gate is applies with a first voltage, which results in Fowler-Nordheim (−FN) hole injection, thereby causing the memory cell to be in a programmed state.
申请公布号 US7839696(B2) 申请公布日期 2010.11.23
申请号 US20090365810 申请日期 2009.02.04
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUE HANG-TING
分类号 G11C16/04 主分类号 G11C16/04
代理机构 代理人
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