发明名称 Image forming method and electron microscope
摘要 As an image forming method including comparison between images for three-dimensional image construction or the like and an apparatus for forming such images, there are provided an image forming method and an electron microscope capable of obtaining with high accuracy or efficiency information required for comparison. In the image forming method, an image is formed on the basis of comparison between a plurality of images obtained by applying an electron beam to a specimen at different tilt angles. The method includes obtaining a first transmission image with the electron beam applied in a first direction and a second transmission image with the electron beam applied in a second direction, the second transmission image being formed within a region different from a peripheral blurred region resulting from tilting, and making a search in the first transmission image by using the second transmission image.
申请公布号 US7838834(B2) 申请公布日期 2010.11.23
申请号 US20080048775 申请日期 2008.03.14
申请人 HITACHI-HIGH TECHNOLOGIES CORPORATION 发明人 NAGAOKI ISAO;NAKAYAMA YOSHIHIKO;ISHII RYOICHI
分类号 G01N23/04 主分类号 G01N23/04
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