发明名称 CMP polishing compound and polishing method
摘要 The present invention relates to a CMP polishing slurry, comprising cerium oxide particles, a dispersing agent, a water-soluble polymer and water, wherein the water-soluble polymer is a compound having a skeleton of any one of an N-mono-substituted product and an N,N-di-substituted product of any one selected from the group consisting of acrylamide, methacrylamide and α-substituted products thereof. The amount of the water-soluble polymer is preferably in the range of 0.01 part or more by weight and 10 parts or less by weight for 100 parts by weight of the polishing slurry. Thus it is possible to provide a polishing slurry and a polishing method which make it possible to polish a film made of silicon oxide or the like effectively and rapidly and further control the process therefor easily in CMP technique for flattening an interlayer insulating film, a BPSG film, an insulator film for shallow trench isolation, and other films.
申请公布号 US7838482(B2) 申请公布日期 2010.11.23
申请号 US20050544073 申请日期 2005.07.29
申请人 HITACHI CHEMICAL CO. LTD. 发明人 FUKASAWA MASATO;YOSHIDA MASATO;KOYAMA NAOYUKI;OOTSUKI YUTO;YAMAGISHI CHIAKI;ENOMOTO KAZUHIRO;HAGA KOUJI;KURATA YASUSHI
分类号 C11D7/02;B24B37/00;C09G1/02;C09K3/14;C11D7/26;C11D7/32;H01L21/304;H01L21/3105 主分类号 C11D7/02
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