发明名称 RESIST FILM FORMING DEVICE
摘要 PROBLEM TO BE SOLVED: To improve quality and yield by forming a resist film uniformly in a resist film forming device for forming a resist film on a surface during a processing step of a photomask or a wafer. SOLUTION: In the resist film forming device, a recess 14 for fitting and holding a photomask 15 is formed in a substrate holding part 13 of a substrate holding and rotating means 12, an air channel forming part 16 in which an opening 17 according to the photomask 15 is formed is provided above a part other than the recess 14 of the substrate holding part 13, and thereby, an air channel is formed to an outer peripheral side from the opening 17 side by rotation through a gap g relative to the substrate holding part 13. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010262997(A) 申请公布日期 2010.11.18
申请号 JP20090111016 申请日期 2009.04.30
申请人 MTC:KK 发明人 WILLIAM COOPER;TAMAKI TAKEO;MIYAZAKI SHINSUKE
分类号 H01L21/027 主分类号 H01L21/027
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