| 摘要 |
With proposed radiation thermometry and radiation thermometry system (10), a thin-film (2) is disposed on a substrate to make a thin-film substrate, and measurement is conducted for polarized radiance components emitted from the thin-film (2) in a direction which is within an angle rangeθeic, from a planar normal line of the thin-film (2), where radiance components remain invariable. A temperature of the thin-film (2) is determined on the basis of the measured results of the polarized radiance components. The polarized radiance components are measured using a radiometer (4) by measuring p-wave polarized radiance components which are parallel to an emitting surface including a direction where the polarized radiance components are measured. A pseudo-blackbody (5) is disposed in a mirror symmetrical state to the radiometer (4), and absorbs and negates background radiations to the radiometer (4). Further, temperatures of the pseudo-blackbody (5) are measured, and will be made allowance for calculation of temperatures of the thin-film (2).
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