发明名称 Method of forming cavity between multilayered wirings
摘要 <p>A method of forming a cavity between metallic wirings using a polymer capable of revealing a specific heat resistant temperature and a specific heat decomposition temperature by having a specific repeating unit structure and a specific molecular weight range and of readily forming a cavity structure between metallic wirings in, for example, semiconductors. The method comprises a step of coating the surface of a first dielectric film formed on a semiconductor substrate with a cyclic olefin based addition polymer, a step of patterning the cyclic olefin based addition polymer as a void-forming polymer, a step of forming a metallic wiring in the pattern formed on the void-forming polymer, a step of forming a second dielectric film on the void-forming polymer containing a metallic wiring, and a step of removing the void-forming polymer between the multilayered wirings by heating to form a cavity between the metallic wirings. </p>
申请公布号 EP1416528(A3) 申请公布日期 2010.11.17
申请号 EP20030024702 申请日期 2003.10.28
申请人 JSR CORPORATION 发明人 KUROSAWA, TAKAHIKO;SHIRATO, KAORI;MARUYAMA, YOUICHIROU
分类号 C08F32/00;H01L21/768;C08G61/06;C09D165/00;H01L21/312;H01L23/522 主分类号 C08F32/00
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