发明名称 Method for growth of GaN single crystal, method for preparation of GaN substrate, process for producing GaN-based element, and GaN-based element
摘要 A GaN-based thin film (thick film) is grown using a metal buffer layer grown on a substrate. (a) A metal buffer layer (210) made of, for example, Cr or Cu is vapor-deposited on a sapphire substrate (120). (b) A substrate obtained by vapor-depositing the metal buffer layer (210) on the sapphire substrate (120) is nitrided in an ammonia gas ambient, thereby forming a metal nitride layer (212). (c) A GaN buffer layer (222) is grown on the nitrided metal buffer layers (210, 212). (d) Finally, a GaN single-crystal layer (220) is grown. This GaN single-crystal layer (220) can be grown to have various thicknesses depending on the objects. A freestanding substrate can be fabricated by selective chemical etching of the substrate fabricated by the above steps. It is also possible to use the substrate fabricated by the above steps as a GaN template substrate for fabricating a GaN-based light emitting diode or laser diode.
申请公布号 US7829435(B2) 申请公布日期 2010.11.09
申请号 US20090545575 申请日期 2009.08.21
申请人 TOHOKU TECHNO ARCH CO., LTD.;FURUKAWA CO., LTD.;MITSUBISHI CHEMICAL CORPORATION;DOWA HOLDINGS CO., LTD.;EPIVALLEY CO., LTD.;WAVESQUARE INC. 发明人 YAO TAKAFUMI;CHO MEOUNG-WHAN
分类号 H01L21/30;H01L33/12;H01L33/32 主分类号 H01L21/30
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