发明名称 NON-VOLATILE MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 <p>PURPOSE: A nonvolatile memory device and a manufacturing method thereof are provided to simplify a memory device manufacturing process and to improve the integration rate of a memory device. CONSTITUTION: A gate pattern includes a tunnel insulating layer(41), a floating gate electrode(42), a charge barrier layer(43), and a control gate electrode(44). The control gate electrode and the charge barrier layer of the gate pattern are formed in the peripheral circuit region. A mask pattern(48) exposes the peripheral circuit region on the first interlayer insulating layer. A first spacer is formed on the sidewall of the gate pattern.</p>
申请公布号 KR20100119433(A) 申请公布日期 2010.11.09
申请号 KR20090038541 申请日期 2009.04.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, NAM JAE
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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