发明名称 |
Resin for photoresist composition, photoresist composition and method for forming resist pattern |
摘要 |
A resin for photoresist compositions is disclosed with excellent resolution and line edge roughness characteristics. A photoresist composition and a method for forming a resist pattern using such a resin are also disclosed. The resin has a hydroxyl group bonded to a carbon atom at a polymer terminal, and the carbon atom in theα-position to the hydroxyl group has at least one electron attractive group.
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申请公布号 |
US7829259(B2) |
申请公布日期 |
2010.11.09 |
申请号 |
US20090365752 |
申请日期 |
2009.02.04 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
HADA HIDEO;TAKESHITA MASARU;MATSUMARU SHOGO;SHIMIZU HIROAKI |
分类号 |
G03F7/033;G03F7/039;C08F2/38;C08F220/28;G03F7/004;G03F7/028;H01L21/027;H01L21/30 |
主分类号 |
G03F7/033 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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