发明名称 High-K dielectric metal gate device structure
摘要 A metal gate/high-k dielectric semiconductor device provides an NMOS gate structure and a PMOS gate structure formed on a semiconductor substrate. The NMOS gate structure includes a high-k gate dielectric treated with a dopant impurity such as La and the high-k gate dielectric material of the PMOS gate structure is deficient of this dopant impurity and further includes a work function tuning layer over the high-k gate dielectric.
申请公布号 US7829949(B2) 申请公布日期 2010.11.09
申请号 US20090589421 申请日期 2009.10.23
申请人 TAIWAN SEMCONDUCTOR MANUFACTURING CO., LTD 发明人 TSENG JOSHUA;LIN KANG-CHENG;YANG JI-YI;HUANG KUO-TAI;CHEN RYAN CHIA-JEN
分类号 H01L27/092 主分类号 H01L27/092
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