发明名称 Photomask and method for forming wiring pattern using the same
摘要 A photomask includes a transparent mask substrate, and a plurality of square mask cells provided on the mask substrate. Each mask cell includes at least one of a light transmitting region and a light shielding region. A planar region (in which the mask cells are formed) of the mask substrate includes a first region, a second region surrounding the first region, and a third region outside the second region. The first region includes a first group of mask cells transmitting lights of a first light intensity greater than zero and less than or equal to 1. The second region includes a second group of mask cells transmitting lights of a second light intensity greater than zero and less than the first light intensity. The third region includes a third group of mask cells transmitting lights of a third light intensity greater than or equal to zero and less than the second light intensity.
申请公布号 US7829247(B2) 申请公布日期 2010.11.09
申请号 US20070892082 申请日期 2007.08.20
申请人 OKI SEMICONDUCTOR CO., LTD. 发明人 MAENO YOSHINORI
分类号 G03C5/00;G03F1/00;G03F1/68;H01L21/027;H01L21/3205;H01L21/768 主分类号 G03C5/00
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