PROBE BLOCK INSPECTION APPARATUS AND TEST COVERAGE

摘要

PURPOSE: An apparatus and a method for inspecting a probe block are provided to rapidly respond to various probe blocks by easily changing various inspection configurations. CONSTITUTION: A microscope driving part(120) is installed on the upper side of a base(110) using a bracket. A microscope(130) is moves to a longitudinal direction and to a transversal direction using the microscope driving part. An inspection unit driving part(160) is installed on the upper side of the base. An inspection unit(150) is moves to the transversal direction by the inspection unit driving part in order to inspect a probe block. A controlling part(170) is in electric connection with the inspection unit and acquires a signal from the inspection unit.