发明名称 APPARATUS AND METHOD FOR MEASURING THICKNESS AND REFRACTIVE INDEX OF SAMPLE
摘要 PURPOSE: A device and a method for measuring the thickness and refractivity of a sample are provided to increase the measurement accuracy of the thickness and refractivity of a sample by using the migration phenomenon of the optical path length due to the refractivity of the sample. CONSTITUTION: A device for measuring the thickness and refractivity of a sample comprises an optical distribution part(20), a reference light reflecting body(30), a measurement light reflecting body(40) and optical detecting part(50). The optical distribution part distributes the light researched from a light source(10) into reference light and measured light. The measurement light reflecting body reflects the measurement light transmitting sample toward the optical distribution part.
申请公布号 KR20100118898(A) 申请公布日期 2010.11.08
申请号 KR20090037835 申请日期 2009.04.29
申请人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 NA, JI HOON;LEE, BYEONG HA;CHOI, HAE YOUNG
分类号 G01B11/06;G01N21/25;G01N21/41;G02B5/00 主分类号 G01B11/06
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