发明名称 |
APPARATUS AND METHOD FOR MEASURING THICKNESS AND REFRACTIVE INDEX OF SAMPLE |
摘要 |
PURPOSE: A device and a method for measuring the thickness and refractivity of a sample are provided to increase the measurement accuracy of the thickness and refractivity of a sample by using the migration phenomenon of the optical path length due to the refractivity of the sample. CONSTITUTION: A device for measuring the thickness and refractivity of a sample comprises an optical distribution part(20), a reference light reflecting body(30), a measurement light reflecting body(40) and optical detecting part(50). The optical distribution part distributes the light researched from a light source(10) into reference light and measured light. The measurement light reflecting body reflects the measurement light transmitting sample toward the optical distribution part.
|
申请公布号 |
KR20100118898(A) |
申请公布日期 |
2010.11.08 |
申请号 |
KR20090037835 |
申请日期 |
2009.04.29 |
申请人 |
GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
NA, JI HOON;LEE, BYEONG HA;CHOI, HAE YOUNG |
分类号 |
G01B11/06;G01N21/25;G01N21/41;G02B5/00 |
主分类号 |
G01B11/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|