发明名称 Method of joining a plurality of SOI substrates on a glass substrate by a heat treatment
摘要 After the plurality of single-crystal semiconductor layers are provided adjacent to each other with a certain distance over a glass substrate which is a support substrate, heat treatment is performed on the glass substrate. The support substrate shrinks by this heat treatment, and the adjacent single-crystal semiconductor layers are in contact with each other due to the shrink. Energy beam irradiation is performed with the plurality of single-crystal semiconductor layers being in contact with each other, the plurality of single-crystal semiconductor layers are integrated, and thus a continuous single-crystal semiconductor layer is formed.
申请公布号 US7825007(B2) 申请公布日期 2010.11.02
申请号 US20080078410 申请日期 2008.03.31
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;ARAI YASUYUKI
分类号 H01L21/30;H01L21/301;H01L21/304;H01L21/46 主分类号 H01L21/30
代理机构 代理人
主权项
地址