发明名称 LOGIC CIRCUIT FOR DETECTING AND RECOVERING ERROR IN SRAM-BASED FIELD PROGRAMMABLE GATE ARRAY
摘要 PURPOSE: A logic circuit for detecting and recovering errors in a SRAM-based field programmable gate array is provided to perform error detection and an error selection function. CONSTITUTION: First circuit units(10,20) generate a first output value by using a time redundancy method about data 0 and data 1. A second circuit unit(30) receives the first output value from the first circuit units. The second circuit unit creates a time redundancy comparison output value and hardware spare comparison output value using the first output value. The second circuit unit detects errors of the first circuit units using the time redundancy comparison output value and hardware spare comparison output value.
申请公布号 KR20100115957(A) 申请公布日期 2010.10.29
申请号 KR20090034634 申请日期 2009.04.21
申请人 SNU R&DB FOUNDATION 发明人 PARK, CHAN GUK;LEE, MIN SU;HEO, SE JONG
分类号 G06F11/08;G06F9/00;G06F11/14;G06F12/00 主分类号 G06F11/08
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