发明名称 Verfahren zur Abscheidung von ternären Oxid-Gatedielektrika und Strukturen, die dadurch gebildet werden
摘要 <p>Methods and associated structures of forming a microelectronic device are described. Those methods may include introducing a first metal source, a second metal source and an oxygen source into a chamber and then forming a ternary oxide film comprising a first percentage of the first metal, a second percentage of the second metal, and a third percentage of oxygen.</p>
申请公布号 DE112008002551(T5) 申请公布日期 2010.10.28
申请号 DE20081102551T 申请日期 2008.09.28
申请人 INTEL CORPORATION 发明人 BRAZIER, MARK R.;METZ, MATTHEW V.;MCSWINEY, MICHAEL L.;KUHN, MARKUS;HATTENDORF, MICHAEL L.
分类号 H01L21/205 主分类号 H01L21/205
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