发明名称 |
Verfahren zur Abscheidung von ternären Oxid-Gatedielektrika und Strukturen, die dadurch gebildet werden |
摘要 |
<p>Methods and associated structures of forming a microelectronic device are described. Those methods may include introducing a first metal source, a second metal source and an oxygen source into a chamber and then forming a ternary oxide film comprising a first percentage of the first metal, a second percentage of the second metal, and a third percentage of oxygen.</p> |
申请公布号 |
DE112008002551(T5) |
申请公布日期 |
2010.10.28 |
申请号 |
DE20081102551T |
申请日期 |
2008.09.28 |
申请人 |
INTEL CORPORATION |
发明人 |
BRAZIER, MARK R.;METZ, MATTHEW V.;MCSWINEY, MICHAEL L.;KUHN, MARKUS;HATTENDORF, MICHAEL L. |
分类号 |
H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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