发明名称 RELIABLE MEMORY CELL
摘要 <p>A method of forming a semiconductor device is presented. A substrate prepared with a second gate is provided. The second gate is processed to form a second gate with a rounded corner and a first gate is formed on the substrate. The first gate is adjacent to and overlaps a portion of the second gate and the rounded corner.</p>
申请公布号 SG165237(A1) 申请公布日期 2010.10.28
申请号 SG20100011104 申请日期 2010.02.22
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD 发明人 PHUA TIMOTHY;INDAJANG BANGUN;KYUN SOHN DONG
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