| 摘要 |
PURPOSE: A test socket for inspecting the electrical performance is provided to secure the inspection reliability without influence by the noise in an inspection process positioning a probe inside the coupling hole of the socket. CONSTITUTION: A coupling hole is perpendicularly formed to an upper side of a conductivity body(110). A lower conductivity body(130) is separately formed in a lower side of the conductivity body. The lower side of the conductivity body is perpendicularly formed to the coupling hole. An insulating film(140) is formed to the insulating material of a plate shape and is formed between the upper and lower side of the conductivity body. |
