发明名称 Implant uniformity control
摘要 An apparatus and method for ion implantation that include destabilizing the ion beam as it passes through magnetic field, preferably a dipole magnetic field is disclosed. By introducing a bias voltage at certain points within the magnetic field, electrons from the plasma are drawn toward the magnet, thereby causing the ion beam to expand due to space charge effects. The bias voltage can be introduced into the magnet in a region where the magnetic field has only one component. Alternatively, the bias voltage can be in a region wherein the magnetic field has two components.
申请公布号 US7820988(B2) 申请公布日期 2010.10.26
申请号 US20080244001 申请日期 2008.10.02
申请人 VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC. 发明人 BENVENISTE VICTOR M.;CUCCHETTI ANTONELLA;KOO BON-WOONG
分类号 H01J37/317;H01L21/265 主分类号 H01J37/317
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