发明名称 |
APPARATUS AND METHOD FOR PLASMA ION DOPING |
摘要 |
PURPOSE: The plasma ion doping device and plasma ion-doping method prevent from electronicses being inserted within wafer. It is offered so that the equal ion implantation be included. CONSTITUTION: The processing chamber(10) defines the space(11) shut tightly. The platen(12) has the conductivity plane for supporting the wafer(W). The process gas source(36) is connected through the flux controller(38) to the processing chamber. It changes the pressure of the processing chamber inside into signal and the pressure sensor(44) offers to the controller(42).
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申请公布号 |
KR20100114180(A) |
申请公布日期 |
2010.10.25 |
申请号 |
KR20090032587 |
申请日期 |
2009.04.15 |
申请人 |
LIGADP CO., LTD. |
发明人 |
YOUN, JONG WEON;YOUK, CHANG YOUNG |
分类号 |
H01L21/265;H01J37/30 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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