发明名称 |
ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, AND METHOD OF FORMING PATTERN USING THE COMPOSITION |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a positive resin composition superior in development residue and outgassing performance, and to provide a method of forming a pattern using the positive resist composition. <P>SOLUTION: The positive resin composition comprises (A) any of compounds expressed by General Formula (I) and (B) a resin that contains a residue (c) of a compound having an ionization potential value lower than that of phenol and when acted on by an acid, exhibits an increased solubility in alkali. In Formula (I): Ar represents an aromatic ring having Cy groups and optionally further other substituents; n is an integer of 2 or greater; Cy represents a group having a substituted or unsubstituted alkyl group or a group having a substituted or unsubstituted cycloaliphatic group, provided that a plurality of Cy groups may be identical with or different from each other; and M<SP>+</SP>represents an organic onium ion. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2010237654(A) |
申请公布日期 |
2010.10.21 |
申请号 |
JP20100040424 |
申请日期 |
2010.02.25 |
申请人 |
FUJIFILM CORP |
发明人 |
TSUBAKI HIDEAKI;SHIRAKAWA KOJI;YAO TADATERU;DOBASHI TORU;TSUCHIMURA TOMOTAKA |
分类号 |
G03F7/039;C08F12/22;G03F7/004 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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