发明名称 PATTERNING METHOD, AND FIELD EFFECT TRANSISTORS
摘要 A patterning method with a filling material with a T-shaped cross section is used as a mask during patterning to produce structures having sublithographic dimensions, such as a double-fin field effect transistor.
申请公布号 US2010264472(A1) 申请公布日期 2010.10.21
申请号 US20100830048 申请日期 2010.07.02
申请人 INFINEON TECHNOLOGIES AG 发明人 FEHLHABER RODGER;TEWS HELMUT
分类号 H01L29/78;H01L21/033;H01L21/308;H01L21/336;H01L29/423;H01L29/786 主分类号 H01L29/78
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