<p>The present invention relates to an optical arrangement and in particular to an optical arrangement for use in electron microscopy applications. This is used for sample characterization with simultaneous measurement with the electron microscopy of the sample and measurements with an optical setup and/or using a manipulator for probing of a light source or a scanning probe device.</p>
申请公布号
WO2010120238(A1)
申请公布日期
2010.10.21
申请号
WO2010SE50405
申请日期
2010.04.15
申请人
NANOFACTORY INSTRUMENTS AB;DANILOV, ANDREY;OLIN, HAAKAN;ANGENETE, JOHAN