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发明名称
TESTABLE INTEGRATED CIRCUIT AND TEST DATA GENERATION METHOD
摘要
申请公布号
EP2135104(B1)
申请公布日期
2010.10.20
申请号
EP20080737705
申请日期
2008.04.03
申请人
NXP B.V.
发明人
HAPKE, FRIEDRICH;WITTKE, MICHAEL;SCHLOEFFEL, JUERGEN
分类号
G01R31/3183
主分类号
G01R31/3183
代理机构
代理人
主权项
地址
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