发明名称 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist composition superior in filtering and line width uniformity, and to provide a pattern forming method using the same. <P>SOLUTION: There are provided the positive resist composition including: (A) an acidolysis resin containing a specific repetition structural unit having an annular alkyl structure; (B) an acid generating agent; and (C) a mixed solvent containing at least one solvent selected from the following (a) group and at least one solvent selected from the following (b) to (d) groups and the pattern forming method. (a) group: alkylene glycol monoalkyl ether. (b) group: alkylene glycol monoalkyl ether carboxylate. (c) group: straight chain ketone, branched chain ketone, annular ketone, lactone, and alkylene carbonate. (d) group: lactate ester, acetic acid ester, and alkoxy propionic acid ester. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010230697(A) 申请公布日期 2010.10.14
申请号 JP20090071006 申请日期 2009.03.23
申请人 FUJIFILM CORP 发明人 YAMAMOTO KEI;SHIBUYA AKINORI
分类号 G03F7/004;G03F7/039 主分类号 G03F7/004
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