发明名称 RESISTIVE-SWITCHING MEMORY ELEMENTS HAVING IMPROVED SWITCHING CHARACTERISTICS
摘要 Resistive-switching memory elements having improved switching characteristics are described, including a memory element having a first electrode and a second electrode, a switching layer between the first electrode and the second electrode, the switching layer comprising a first metal oxide having a first bandgap greater than 4 electron volts (eV), the switching layer having a first thickness, and a coupling layer between the switching layer and the second electrode, the coupling layer comprising a second metal oxide having a second bandgap greater the first bandgap, the coupling layer having a second thickness that is less than 25 percent of the first thickness.
申请公布号 WO2010118380(A2) 申请公布日期 2010.10.14
申请号 WO2010US30619 申请日期 2010.04.09
申请人 INTERMOLECULAR, INC.;KUSE, RONALD, JOHN;PHATAK, PRASHANT;CHIANG, TONY;MILLER, MICHAEL;TONG, JINHONG;WU, WEN;HASHIM, IMRAN 发明人 KUSE, RONALD, JOHN;PHATAK, PRASHANT;CHIANG, TONY;MILLER, MICHAEL;TONG, JINHONG;WU, WEN;HASHIM, IMRAN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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