发明名称 Method of forming trench isolation
摘要 A wet etching method of removing silicon from a substrate includes depositing a layer comprising silicon in elemental form over a substrate. The layer is exposed to an aqueous liquid etching solution comprising a hydroxide and a fluoride, and having a pH of at least 10, under conditions and for a period of time effective to etch the elemental silicon from the substrate. Wet etching can be employed in methods of forming trench isolation, and in other methods. Other aspects and implementations are contemplated.
申请公布号 US7811897(B2) 申请公布日期 2010.10.12
申请号 US20060583633 申请日期 2006.10.18
申请人 发明人 FUCSKO JANOS;WALDO GRADY S.
分类号 H01L21/465 主分类号 H01L21/465
代理机构 代理人
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