发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a method for manufacturing the same are provided to obtain a buffer layer having a conductivity which is higher than that of an oxide semiconductor layer by reducing contact resistance. CONSTITUTION: A gate electrode layer is formed on a substrate. A gate insulating layer is formed on the gate electrode layer. A conductive film is formed on the gate insulating layer. A first oxide semiconductor film is formed on the conductive film. The conductive film and the first oxide semiconductor film are etched. A source electrode layer and a drain electrode layer(105a, 105b) are formed. A second oxide semiconductor film is formed on the source electrode layer. A third oxide semiconductor film is formed on the drain electrode layer. |
申请公布号 |
KR20100110278(A) |
申请公布日期 |
2010.10.12 |
申请号 |
KR20100029854 |
申请日期 |
2010.04.01 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
ASANO YUJI;KOEZUKA JUNICHI |
分类号 |
H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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