发明名称 System managing gas flow between chambers of an extreme ultraviolet (EUV) photolithography apparatus
摘要 A gas flow management system may comprise a first and second enclosing walls at least partially surrounding first and second respective spaces; a system generating plasma in the first space, the plasma emitting extreme ultraviolet light; an elongated body restricting flow from the first space to the second space, the body at least partially surrounding a passageway and having a first open end allowing EUV light to enter the passageway from the first space and a second open end allowing EUV light to exit the passageway into the second space, the body shaped to establish a location having a reduced cross-sectional area relative to the first and second ends; and a flow of gas exiting an aperture, the aperture positioned to introduce gas into the passageway at a position between the first end of the body and the location having a reduced cross-sectional area.
申请公布号 US7812329(B2) 申请公布日期 2010.10.12
申请号 US20070002073 申请日期 2007.12.14
申请人 CYMER, INC. 发明人 BYKANOV ALEXANDER N.;BRANDT DAVID C.;FOMENKOV IGOR V.;PARTLO WILLIAM N.
分类号 G21K5/00 主分类号 G21K5/00
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