发明名称 CONNECTOR FOR TEST DEVICE
摘要 PURPOSE: A connector for a test device is provided to pressure a driving member with small force by providing a ZIF(Zero Insertion Force) connector which controls the contact between a plug pin and a plug. CONSTITUTION: A plug(23) is electrically connected to a semiconductor device, and a connector(30) is formed on at a test board and is coupled to the plug. A driving member(34) presses the connector. A driving unit(60) includes a magnetic switch which drives the driving member through an on/off signal, and a control unit(70) controls the on/off operation of the driving unit. The connector includes a connector pin distanced from the plug and is connected to or disconnected from the plug depending on the motion of the pressing member.
申请公布号 KR20100109287(A) 申请公布日期 2010.10.08
申请号 KR20090027839 申请日期 2009.03.31
申请人 KOREA ELECTRONICS ASSOCIATION;EXICON CO., LTD. 发明人 YU, KYO SUN
分类号 H01R33/76;G01R1/067 主分类号 H01R33/76
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