发明名称 TEMPERATURE CONTROL DEVICE, TEMPERATURE CONTROL METHOD, AND SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a temperature control device with excellent heating responsiveness and cooling responsiveness without complicating a device structure even if commonly using a cooling layer and a heating layer. SOLUTION: The temperature control device includes a susceptor 12 for placing a wafer, and a shower head 22 arranged to face the susceptor 12, excites a processing gas supplied between the susceptor 12 and the shower head 22 thereby to generate plasma, and controls a temperature of a member to be exposed to plasma in a substrate treatment apparatus performing plasma treatment on the wafer by the use of the plasma. The temperature control device includes a heating layer 31 configured to heat an upper electrode plate 24 arranged in the shower head 22, a heat insulating layer 32 positioned in contact with an opposite surface to the surface of the heating layer 31 which faces the upper electrode plate 24, and a cooling layer 33 positioned in contact with an opposite surface to the surface of the heat insulating layer 32 which faces the heating layer 31. Flowing water is used as the cooling medium of the cooling layer 33. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010225642(A) 申请公布日期 2010.10.07
申请号 JP20090068287 申请日期 2009.03.19
申请人 TOKYO ELECTRON LTD 发明人 ISHIDA HISAFUMI
分类号 H01L21/3065 主分类号 H01L21/3065
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