| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a surface flaw inspecting device, capable of further enhancing the inspection precision, based on the data from both sides of a metal strip, with respect to the flaw produced on the surface of the metal strip, and to provide a surface flaw inspecting method. <P>SOLUTION: The surface flaw inspecting device 10, for inspecting the flaw on the surface of the fed metal strip F. The device 10 has a first and second imaging parts 101 and 201 for imaging the first and second surfaces of the metal strip F, first and second extraction parts 103 for extracting the feature data containing the position data of the flaw candidate on the first or second surface side of the metal strip F, on the basis of the imaged first or second image; a closet approach specifying section131 for specifying the flaw candidate on either one of the first and second surface sides of the closest approach with respect to the flaw candidate on the other one of the first and second surface sides, on the basis of the position data of the flaw candidates on the first and second surface sides to allow both flaw candidates to correspond to each other and an one-side determining section132 for determining, at least one of the kind and degree of the flaw candidate on one side on the basis of the feature data of the flaw candidates on both sides which are allowed to correspond to each other. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
