发明名称 THIN-FILM TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a thin-film transistor capable of using microcrystal silicon as a channel region and excellently suppressing a leakage current, and to provide a method of manufacturing the same. SOLUTION: The thin-film transistor 100 includes, as indicated in Fig.1, a substrate 11, a gate electrode 112, a gate insulating film 113, a semiconductor layer (channel region) 114, an etching stopper film 115, heavily doped amorphous silicon layers 116 and 117, a drain electrode 118, a source electrode 119, and lightly doped semiconductor layers 120 and 121. Between the channel region 114 using the microcrystal silicon and the heavily doped amorphous silicon layer 116 and/or the heavily doped amorphous silicon layer 117, the lightly doped semiconductor layers 120 and 121 are provided. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010225781(A) 申请公布日期 2010.10.07
申请号 JP20090070506 申请日期 2009.03.23
申请人 CASIO COMPUTER CO LTD 发明人 MOROSAWA KATSUHIKO
分类号 H01L21/336;H01L21/8234;H01L27/08;H01L27/088;H01L29/786;H01L51/50;H05B33/10 主分类号 H01L21/336
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