发明名称 PHOTOLITHOGRAPHY SYSTEMS AND ASSOCIATED METHODS OF SELECTIVE DIE EXPOSURE
摘要 Several embodiments of photolithography systems and associated methods of selective die exposure are disclosed herein. In one embodiment, a method for exposing a microelectronic substrate in a photolithography system includes producing an illumination radiation from a radiation source and identifying a field on the microelectronic substrate to be exposed. The field is partitioned into a first region discrete from a second region. The method further includes inhibiting the illumination radiation to expose the first region while simultaneously exposing the second region to the illumination radiation.
申请公布号 US2010253929(A1) 申请公布日期 2010.10.07
申请号 US20090419744 申请日期 2009.04.07
申请人 MICRON TECHNOLOGY, INC. 发明人 STANTON WILLIAM A.;SANDHU GURTEJ S.
分类号 G03B27/72;G02F1/03;G03F7/20 主分类号 G03B27/72
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