发明名称
摘要 <p>PROBLEM TO BE SOLVED: To provide an optical measuring method of the characteristic of a metal. SOLUTION: A metal sample S is irradiated with linearly polarized excitation pulse light PU shorter than a lattice vibration frequency of the metal sample, and linearly polarized search pulse light PR1 is time delayed in the direction perpendicular to the polarization direction of excitation pulse light and the excitation pulse light irradiation position of the metal sample is irradiated therewith, and search pulse light PR2 reflected by the metal sample is detected by a photodetector D. The operation is repeated simultaneously with changing a delayed time, to thereby detect a vibration profile reflecting the lattice vibration of the metal.</p>
申请公布号 JP4558217(B2) 申请公布日期 2010.10.06
申请号 JP20010005615 申请日期 2001.01.12
申请人 发明人
分类号 G01N33/20;G01N21/21;G01N21/55 主分类号 G01N33/20
代理机构 代理人
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