发明名称 |
TESTING DEVICE, CALIBRATION METHOD, AND PROGRAM |
摘要 |
<p>Provided are a testing device which comprises a response characteristic detection section for detecting the difference between response time to the rising waveform and response time to the falling waveform in a comparator on the basis of the result of the measurement of each of the waveforms and each of the reflection waveforms in the comparator, wherein the response characteristic detection section calculates the difference between the output characteristic of a rising waveform and the output characteristic of a falling waveform in a driver on the basis of the result of the measurement of each of the waveforms and each of the reflection waveforms in the comparator, and corrects the difference between the sets of response time in the comparator on the basis of the difference between the output characteristics; a calibration method; and a program which causes the testing device to operate.</p> |
申请公布号 |
WO2010109847(A1) |
申请公布日期 |
2010.09.30 |
申请号 |
WO2010JP02034 |
申请日期 |
2010.03.23 |
申请人 |
ADVANTEST CORPORATION;HABU, MASAHIRO |
发明人 |
HABU, MASAHIRO |
分类号 |
G01R31/319;G01R31/28 |
主分类号 |
G01R31/319 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|