发明名称 CHARGED PARTICLE IRRADIATION SYSTEM AND IRRADIATION PLANNING EQUIPMENT
摘要 In a charged particle irradiation system, forming a uniform dose distribution is required by irradiating a moving irradiation object through beam scanning and energy stacking. The charged particle irradiation system includes an ion beam generator 1 from which an ion beam is extracted with a target beam current value thereof set; an irradiation nozzle 21 having scanning magnets 23, 24 and an energy filter 26, the irradiation nozzle 21 for irradiating an irradiation object with the ion beam; and an irradiation object monitoring unit 66 for measuring a position of the irradiation object and outputting signals that vary with time according to displacement of the irradiation object. The charged particle irradiation system determines extraction timing of the ion beam based on the signal outputted from the irradiation object monitoring unit 66 and sequentially changes energies of the ion beam to thereby perform a repainting irradiation with each of the energies.
申请公布号 US2010243911(A1) 申请公布日期 2010.09.30
申请号 US20100715098 申请日期 2010.03.01
申请人 HITACHI, LTD. 发明人 FUJII YUSUKE;HIRAMOTO KAZUO;NAGAMINE YOSHIHIKO
分类号 A61N5/10;H01J37/147;H01J37/244;H01J37/30 主分类号 A61N5/10
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