| 摘要 |
<P>PROBLEM TO BE SOLVED: To allow the strength and elongation of a copper alloy as an electronic component to be balanced, and to facilitate production control. Ž<P>SOLUTION: Copper alloy contains, by weight, 0.005 to 0.5% Zr and B in the range of 0.2 to 400 ppm, and has a layered structure composed in such a manner that crystal grain layers made of a plurality of flat crystal grains continuous in a plane direction are laminated in a sheet thickness direction, The thickness of the crystal grain layer lies in the range of 20 to 550 nm, A peak value P in a histogram of the thickness of the crystal grain layers in the layered structure lies in the range of 50 to 300 nm, and is also present at the frequency of ≥22% of the total frequency, and the half-value width L thereof is ≤200 nm. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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