发明名称 PROCESS OF PREPARING AN ANISOTROPIC MULTILAYER USING PARTICLE BEAM ALIGNMENT
摘要 The invention relates to a process of preparing a multilayer comprising two or more anisotropic layers with different optical axes by using a particle beam etching technique, to a multilayer obtained by said process, to the use of such a multilayer as optical compensator or retarder in optical and electrooptical devices, and to devices comprising such a multilayer.
申请公布号 WO2010108593(A1) 申请公布日期 2010.09.30
申请号 WO2010EP01500 申请日期 2010.03.11
申请人 MERCK PATENT GMBH;PARRI, OWAIN, LLYR;YAROSHCHUK, OLEG 发明人 PARRI, OWAIN, LLYR;YAROSHCHUK, OLEG
分类号 G02F1/1337;B32B37/00;G02F1/13363 主分类号 G02F1/1337
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