Method and system for analyzing performance metrics of array type circuits under process variability

摘要

A method for analyzing a performance metric of an array type of electronic circuit under process variability effects is a two-step method which comprises a first step (20) of deriving statistics of the access path (model of the array type of electronic circuit, comprising building blocks containing all hardware to access one array element in the array) due to variations in the building blocks under process variability of the basic elements, and a second step (21) of deriving statistics of the full array type of electronic circuit by combining the results of the statistics of the access path under awareness of the array architecture.