发明名称 SIGNAL QUALITY MEASURING APPARATUS AND METHOD THEREOF
摘要 PURPOSE: A signal quality measuring apparatus and a method thereof is provided to measure the quality of an input signal by using the level information of an extracted input signal from the relation between an input signal and the binary signal of the input signal. CONSTITUTION: A binary signal generating unit(110) generates a binary signal from an input signal. A level information extraction unit(120) extracts the relation between input signal and the binary signal by using the length of at least two windows. A quality operation unit(130) computes the quality of an input signal by using the extracted level information.
申请公布号 KR20100105330(A) 申请公布日期 2010.09.29
申请号 KR20090106666 申请日期 2009.11.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, HYUN SOO;LEE, KYUNG GEUN;HWANG, IN OH;ZHAO HUI;SHIN, JONG HYUN
分类号 H04L1/20;G11B20/10;G11B20/18 主分类号 H04L1/20
代理机构 代理人
主权项
地址
您可能感兴趣的专利