发明名称 Semiconductor device having plural DRAM memory cells and a logic circuit and method for manufacturing the same
摘要 A memory cell capacitor (C3) of a DRAM is formed by use of a MIM capacitor which uses as its electrode a metal wiring line of the same layer (M3) as metal wiring lines within a logic circuit (LOGIC), thereby enabling reduction of process costs. Higher integration is achievable by forming the capacitor using a high dielectric constant material and disposing it above a wiring layer in which bit lines (BL) are formed. In addition, using 2T cells makes it possible to provide a sufficient signal amount even when letting them operate with a low voltage. By commonizing the processes for fabricating capacitors in analog (ANALOG) and memory (MEM), it is possible to realize a semiconductor integrated circuit with the logic, analog and memory mounted together on one chip at low costs.
申请公布号 US7804118(B2) 申请公布日期 2010.09.28
申请号 US20090635181 申请日期 2009.12.10
申请人 RENESAS TECHNOLOGY CORP. 发明人 AKIYAMA SATORU;WATANABE TAKAO;MATSUI YUICHI;HIRATANI MASAHIKO
分类号 H01L29/78;H01L21/8239;H01L21/8242;H01L23/522;H01L27/10;H01L27/105;H01L27/108;H01L27/115 主分类号 H01L29/78
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