| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To quickly investigate the cause of a defect in a production process. <P>SOLUTION: A quality information collection analysis system includes: at least one assembly installation having at least one assembly machine which assembles a component; at least one inspection device which inspects the assembly having the components assembled by the assembly machine; and a quality collection analysis device which manages the quality information of the assembly. The assembly device has an assembly device production time output means which outputs the assembly time of the assembly. The inspection device has an inspection information output means which outputs the inspection result of the assembly. The quality collection analysis device has: an assembly device production time input means which inputs the assembly time output by the assembly device production time output means; an inspection information input means which inputs the inspection information output by the inspection information output means; a storage part which stores the information on the components; and an analysis means which analyzes defect causes using the assembly time and the inspection result. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
