发明名称 POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive resist composition capable of forming a resist film having a surface having high hydrophobicity, and to provide a resist pattern forming method by use of the positive resist composition. <P>SOLUTION: The positive resist composition contains a high molecular compound (A1) having a constituent unit (aO) containing "cyclic group including -SO<SB>2</SB>-" at a terminal of side chain and a constituent unit (a1) induced from an acrylic ester including an acid dissociative dissolution inhibition group, an acid generator component (B), and a fluorine containing resin component having a group containing the acid dissociative dissolution inhibition group which may have fluorine atoms and a constituent unit (f1) including at least one fluorine atom. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010210835(A) 申请公布日期 2010.09.24
申请号 JP20090055745 申请日期 2009.03.09
申请人 TOKYO OHKA KOGYO CO LTD 发明人 KUROSAWA TSUYOSHI;SHIMIZU HIROAKI
分类号 G03F7/039;C08F120/22;C08F220/38;G03F7/004;H01L21/027 主分类号 G03F7/039
代理机构 代理人
主权项
地址