| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of inspecting an electrophotographic photoreceptor of improved accuracy without reducing the productivity. Ž<P>SOLUTION: In a first step of optical inspection, white light is radiated to the electrophotographic photoreceptor, and the existence of a false defect of a photoreceptor is determined based on the current value measured when its reflected light is measured. In a first step of electric inspection, a conductive roller is pressure-contacted to the photoreceptor surface, direct voltage is applied while the photoreceptor is rotated, the current flowing from the conductive roller to the photoreceptor is measured, and the existence of a defect of the photoreceptor is determined based on the measured current value. In a second step of optical inspection, a laser light is radiated to only a photoreceptor where a false defect is detected in the first step of optical inspection and no defect is detected in the first step of electric inspection, among inspected photoreceptors; the reflected light of the light is measured; and the existence of a false defect of the photoreceptor is determined based on the measured current value. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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