发明名称 SIGNAL QUALITY MEASURING APPARATUS AND METHOD THEREOF
摘要 A signal quality measuring apparatus includes a binary signal generating unit to generate a binary signal from an input signal; a level information extracting unit to extract level information from a relationship between the input signal and the binary signal using at least two window lengths; and a quality calculating unit to calculate a quality of the input signal based on the level information.
申请公布号 WO2010107218(A2) 申请公布日期 2010.09.23
申请号 WO2010KR01606 申请日期 2010.03.16
申请人 SAMSUNG ELECTRONICS CO,. LTD. 发明人 PARK, HYUN-SOO;LEE, KYUNG-GEUN;HWANG, IN-OH;ZHAO, HUI;SHIN, JONG-HYUN
分类号 H04L1/20 主分类号 H04L1/20
代理机构 代理人
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