发明名称
摘要 According to one embodiment, a method for aligning a first alignment marker with respect to a second alignment marker, a lens being positioned in between the markers, includes providing an alignment beam and imaging the first alignment marker on the second alignment marker with the alignment beam through the lens. A lens interferometer is provided as a measurement device arranged to measure a relative position of at least one of the first and second alignment markers. The method further includes measuring the relative position and aligning the position of at least one of the first and second alignment markers based on the measured relative position.
申请公布号 JP4549957(B2) 申请公布日期 2010.09.22
申请号 JP20050263864 申请日期 2005.09.12
申请人 发明人
分类号 H01L21/027;G01B11/00 主分类号 H01L21/027
代理机构 代理人
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