| 发明名称 |
Current-actuated-display backplane tester and method |
| 摘要 |
A backplane (102) test system is provided that uses a pressed or deposited resistive film (120) and infra-red (IR) imaging (160) to visualize and quantify the current drive of pixels. In one form, the system is used for measuring organic light-emitting-diode (OLED) backplanes or other current-actuated-display (CAD) backplanes.
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| 申请公布号 |
EP2230661(A2) |
申请公布日期 |
2010.09.22 |
| 申请号 |
EP20100156695 |
申请日期 |
2010.03.17 |
| 申请人 |
PALO ALTO RESEARCH CENTER INCORPORATED |
发明人 |
APTE, RAJ B.;LU, JENG PING;HO, JACKSON H. |
| 分类号 |
G09G3/00 |
主分类号 |
G09G3/00 |
| 代理机构 |
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